Standard Probe cards

Альтернативный текст

„Star“ probes arrangement (each of the probes is placed at a certain angle to the preceded one).

Design and production of probe cards of this type for chip testing with pads, spread throughout the whole chip space, is available.

For testing the chips with the pad pitch less than 50 µm, as a standard, the multi-layer (up to 4 layers) spider construction is applied.

Table of standard parameters:

Parameter Value
X-Y probe positioning (µm) ±10
Planarity (µm) 20
Pad pitch (µm) 50
Pad size (µm) 50х50
Accuracy for the working height provided (mm) ±0.25