Probe cards, heads and precise testing equipment.
Cards with parallel arrangement of probes
Probes in a spider are laid parallel to each other. This excludes probability of diagonal scrub to the pad (which is especially actual for rectangular pad shape).
Design and production of probe cards of this type for testing chips with pads located within the whole space of the chip is available.
Table of standard parameters:
| Parameter | Value |
| X-Y probe positioning (µm) | < ±10 |
| Planarity (µm) | < 12,5 |
| Pad pitch (µm) | 70 |
| Pad size (µm) | min. 60х60 |
| Accuracy for the working height provided (mm) | ±0.25 |